• DocumentCode
    2254308
  • Title

    Development of the guide for performing arc-flash hazard calculations

  • Author

    Doan, Daniel ; Kemp, Herman O. ; Saporita, Vince ; Gregory, George D. ; Mcclung, Bruce ; Wellman, Craig M.

  • Author_Institution
    DuPont Co., Wilmington, DE, USA
  • fYear
    2003
  • fDate
    15-17 Sept. 2003
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    This paper reports on the accomplishments of the IEEE 1584™ Working Group. This working group raised money for testing, oversaw a significant amount of testing, analyzed the data, developed a new model for incident energy calculation and wrote IEEE 1584™ IEEE Guide for Performing Arc Flash Hazard Calculations. The paper discusses: the working group´s starting point; the need for laboratory testing; the test and analysis methods employed; the discovery from the testing; the development of the model and the guide; and the need for further work. IEEE 1584™-2002 significantly updates prior information on conducting an arc flash hazard analysis in accuracy, usability, and depth. The guide offers a new empirically derived model for enclosed equipment and some open lines for voltages from 208 volt to 15 kilovolts and a theoretically-derived model for applications involving higher voltages or large gaps between conductors. Included with this guide are programs with embedded equations, which may be used to determine incident energy and the arc flash protection boundary.
  • Keywords
    IEEE standards; arcs (electric); design of experiments; protection; testing; 208 V to 15 kV; IEEE 1584 Working Group; IEEE 1584-2002; arc flash protection boundary; arc-flash hazard calculations; design of experiments; embedded equations; incident energy; incident energy calculation; laboratory testing; testing; Conductors; Data analysis; Hazards; Information analysis; Laboratories; Performance analysis; Performance evaluation; Testing; Usability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Petroleum and Chemical Industry Conference, 2003. Record of Conference Papers. IEEE Industry Applications Society 50th Annual
  • ISSN
    0090-3507
  • Print_ISBN
    0-7803-7956-X
  • Type

    conf

  • DOI
    10.1109/PCICON.2003.1242594
  • Filename
    1242594