Title :
The probability of a subspace swap in the SVD
Author :
Thomas, John K. ; Scharf, Louis L. ; Tufts, Donald W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Abstract :
We extend the work of Tufts, Kot, and Vaccaro (1987, 1991) to improve the analytical characterization of threshold breakdown in SVD methods. Our results sharpen the Tufts, Kot, and Vaccaro results and lower bound the probability of a subspace swap in the SVD
Keywords :
probability; signal processing; singular value decomposition; SVD methods; lower bound; probability; singular value decomposition; subspace swap; threshold breakdown; Electric breakdown; Energy resolution; Equations; Mathematics; Modal analysis; Random variables; Signal analysis; Signal processing; Signal resolution; Signal to noise ratio;
Conference_Titel :
Signals, Systems and Computers, 1993. 1993 Conference Record of The Twenty-Seventh Asilomar Conference on
Conference_Location :
Pacific Grove, CA
Print_ISBN :
0-8186-4120-7
DOI :
10.1109/ACSSC.1993.342528
