Title :
Loading effect of EUT on maximal electric field level in a reverberation chamber for immunity test
Author :
Zhang, Daming ; Li, Erping
Author_Institution :
Electromagn. Compatibility Div., Inst. of High Performance Comput., Singapore, Singapore
Abstract :
For an EMC immunity test, the maximal electric field generated by a test facility arouses a lot of concerns. This paper presents a technique to evaluate the loading effect of EUT on the maximal electric field level in a reverberation chamber. The influence of EUT is studied with different conductivities. From the results it is seen that the EUT could sharply load the reverberation chamber when it presents large surface area but low conductivities.
Keywords :
electric fields; electromagnetic compatibility; equivalent circuits; reverberation chambers; EMC immunity test; EUT loading effect; conductivities; maximal electric field level; reverberation chamber; surface area; test facility; Antenna measurements; Circuit simulation; Conductivity; Electromagnetic compatibility; Frequency; Immunity testing; Power generation; RLC circuits; Reverberation chamber; Sampling methods;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032827
