Title :
Artifacts in near-field scanning optical microscope spectroscopy and imaging of nanoparticles
Author :
Chang, Shih-Hui ; Chang, Yun-Chorng
Author_Institution :
Inst. of Electro-Opt. Sci. & Eng., Nat. Cheng-Kung Univ., Tainan
Abstract :
NSOM spectroscopy and imaging of nanoparticles in both illumination and collection mode were studied. The artifacts of red-shifting in NSOM spectra and polarization dependant dark fringe patterns associated with each scattering resonant peak were explained.
Keywords :
nanoparticles; near-field scanning optical microscopy; optical microscopes; dark fringe patterns; nanoparticles imaging; near-field scanning optical microscope spectroscopy; Finite difference methods; Lighting; Nanoparticles; Optical imaging; Optical microscopy; Optical scattering; Resonance light scattering; Spectroscopy; Time domain analysis; Ultrafast optics; (180.4243) Near-field microscopy; (240.6490) surface Spectroscopy; (240.6680)Surface plasmons;
Conference_Titel :
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-55752-859-9
