DocumentCode :
2254722
Title :
Power Variance Analysis breaks a masked ASIC implementation of AES
Author :
Li, Yang ; Sakiyama, Kazuo ; Batina, Lejla ; Nakatsu, Daisuke ; Ohta, Kazuo
Author_Institution :
Univ. of Electro-Commun., Tokyo, Japan
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
1059
Lastpage :
1064
Abstract :
To obtain a better trade-off between cost and security, practical DPA countermeasures are not likely to deploy full masking that uses one distinct mask bit for each signal. A common approach is to use the same mask on several instances of an algorithm. This paper proposes a novel power analysis method called Power Variance Analysis (PVA) to reveal the danger of such implementations. PVA uses the fact that the side-channel leakage of parallel circuits has a big variance when they are given the same but random inputs. This paper introduces the basic principle of PVA and a series of PVA experiments including a successful PVA attack against a prototype RSL-AES implemented on SASEBO-R.
Keywords :
application specific integrated circuits; cryptography; AES; ASIC implementation; DPA; parallel circuits; power analysis method; power variance analysis; side-channel leakage; Analysis of variance; Application specific integrated circuits; Costs; Cryptography; Energy consumption; Hardware; Prototypes; Security; Signal analysis; Software prototyping; Masking; RSL; Side Channel Attacks; Variance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5456966
Filename :
5456966
Link To Document :
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