• DocumentCode
    2254722
  • Title

    Power Variance Analysis breaks a masked ASIC implementation of AES

  • Author

    Li, Yang ; Sakiyama, Kazuo ; Batina, Lejla ; Nakatsu, Daisuke ; Ohta, Kazuo

  • Author_Institution
    Univ. of Electro-Commun., Tokyo, Japan
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1059
  • Lastpage
    1064
  • Abstract
    To obtain a better trade-off between cost and security, practical DPA countermeasures are not likely to deploy full masking that uses one distinct mask bit for each signal. A common approach is to use the same mask on several instances of an algorithm. This paper proposes a novel power analysis method called Power Variance Analysis (PVA) to reveal the danger of such implementations. PVA uses the fact that the side-channel leakage of parallel circuits has a big variance when they are given the same but random inputs. This paper introduces the basic principle of PVA and a series of PVA experiments including a successful PVA attack against a prototype RSL-AES implemented on SASEBO-R.
  • Keywords
    application specific integrated circuits; cryptography; AES; ASIC implementation; DPA; parallel circuits; power analysis method; power variance analysis; side-channel leakage; Analysis of variance; Application specific integrated circuits; Costs; Cryptography; Energy consumption; Hardware; Prototypes; Security; Signal analysis; Software prototyping; Masking; RSL; Side Channel Attacks; Variance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5456966
  • Filename
    5456966