Radiated emission analysis of power bus noise by using a power current model of an LSI

Author

Fukumoto, Yukihiro ; Shibata, Osamu ; Takayama, Keisuke ; Kinoshita, Tomohiro ; Wang, Zhi Liang ; Toyota, Yoshitake ; Wada, Osami ; Koga, Ryuji

Author_Institution

Matsushita Electr. Ind. Co. Ltd., Osaka, Japan

Volume

2

fYear

2002

fDate

19-23 Aug. 2002

Firstpage

1037

Abstract

In this paper, a power current model of an LSI was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.

Keywords

capacitance; electromagnetic compatibility; electromagnetic interference; equivalent circuits; inductance; large scale integration; EMC; EMI; LSI power current model; internal decoupling capacitance; internal decoupling inductance; power bus noise; radiated emission analysis; simulated radiation noise; Capacitance; Circuit noise; Circuit simulation; Dielectrics; Electromagnetic interference; Integrated circuit noise; Large scale integration; Noise measurement; Printed circuits; Resonance;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on

Conference_Location

Minneapolis, MN, USA

Print_ISBN

0-7803-7264-6

Type

conf

DOI

10.1109/ISEMC.2002.1032839

Filename

1032839