Title :
Radiated emission analysis of power bus noise by using a power current model of an LSI
Author :
Fukumoto, Yukihiro ; Shibata, Osamu ; Takayama, Keisuke ; Kinoshita, Tomohiro ; Wang, Zhi Liang ; Toyota, Yoshitake ; Wada, Osami ; Koga, Ryuji
Author_Institution :
Matsushita Electr. Ind. Co. Ltd., Osaka, Japan
Abstract :
In this paper, a power current model of an LSI was used for analysis of radiated emissions. The simulated radiation noise was compared with measurements by using an evaluation module that emulates an LSI. The simulation results showed good agreement with the measurement results. The effects of adding an internal decoupling capacitance and/or internal decoupling inductance to an LSI were also evaluated.
Keywords :
capacitance; electromagnetic compatibility; electromagnetic interference; equivalent circuits; inductance; large scale integration; EMC; EMI; LSI power current model; internal decoupling capacitance; internal decoupling inductance; power bus noise; radiated emission analysis; simulated radiation noise; Capacitance; Circuit noise; Circuit simulation; Dielectrics; Electromagnetic interference; Integrated circuit noise; Large scale integration; Noise measurement; Printed circuits; Resonance;
Conference_Titel :
Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7264-6
DOI :
10.1109/ISEMC.2002.1032839
