Title :
General behavioral thermal modeling and characterization for multi-core microprocessor design
Author :
Eguia, Thom J A ; Tan, Sheldon X -D ; Shen, Ruijing ; Pacheco, Eduardo H. ; Tirumala, Murli
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
Abstract :
This paper proposes a new architecture-level thermal modeling method to address the emerging thermal related analysis and optimization problem for high-performance multi-core microprocessor design. The new approach builds the thermal behavioral models from the measured or simulated thermal and power information at the architecture level for multi-core processors. Compared with existing behavioral thermal modeling algorithms, the proposed method can build the behavioral models from given arbitrary transient power and temperature waveforms used as the training data. Such an approach can make the modeling process much easier and less restrictive than before, and more amenable for practical measured data. The new method is based on a subspace identification method to build the thermal models, which first generates a Hankel matrix of Markov parameters, from which state matrices are obtained through minimum square optimization. To overcome the overfitting problems of the subspace method, the new method employs an overfitting mitigation technique to improve model accuracy and predictive ability. Experimental results on a real quad-core microprocessor show that ThermSID is more accurate than the existing ThermPOF method. Furthermore, the proposed overfitting mitigation technique is shown to significantly improve modeling accuracy and predictability.
Keywords :
Hankel matrices; Markov processes; integrated circuit design; microprocessor chips; multiprocessing systems; thermal analysis; Hankel matrix; Markov parameters; ThermPOF method; ThermSID method; arbitrary transient power; architecture-level thermal modeling method; behavioral thermal modeling algorithms; minimum square optimization; multicore microprocessor design; optimization problem; overfitting mitigation technique; quad-core microprocessor; state matrices; subspace identification method; temperature waveforms; thermal related analysis; Accuracy; Microprocessors; Multicore processing; Packaging; Power system modeling; Predictive models; Temperature; Thermal conductivity; Thermal engineering; Training data; Thermal analysis; architecture thermal modeling; multicore processor;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5456979