DocumentCode
2255007
Title
Properties of and improvements to time-domain dynamic thermal analysis algorithms
Author
Chen, Xi ; Dick, Robert P. ; Shang, Li
Author_Institution
EECS Dept., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2010
fDate
8-12 March 2010
Firstpage
1165
Lastpage
1170
Abstract
Temperature has a strong influence on integrated circuit (IC) performance, power consumption, and reliability. However, accurate thermal analysis can impose high computation costs during the IC design process. We analyze the performance and accuracies of a variety of time-domain dynamic thermal analysis techniques and use our findings to propose a new analysis technique that improves performance by 38-138?? relative to popular methods such as the fourth-order globally adaptive Runge-Kutta method while maintaining accuracy. More precisely, we prove that the step sizes of step doubling based globally adaptive fourth-order Runge-Kutta method and Runge-Kutta-Fehlberg methods always converge to a constant value regardless of the initial power profile, thermal profile, and error threshold during dynamic thermal analysis. Thus, these widely-used techniques are unable to adapt to the requirements of individual problems, resulting in poor performance. We also determine the effect of using a number of temperature update functions and step size adaptation methods for dynamic thermal analysis, and identify the most promising approach considered. Based on these observations, we propose FATA, a temporally-adaptive technique for fast and accurate dynamic thermal analysis.
Keywords
Runge-Kutta methods; integrated circuit design; integrated circuit reliability; thermal analysis; time-domain analysis; IC design process; Runge-Kutta-Fehlberg method; accurate thermal analysis; error threshold; fourth-order globally adaptive Runge-Kutta method; initial power profile; power consumption; reliability; thermal profile; time-domain dynamic thermal analysis integrated circuit performance; Algorithm design and analysis; Energy consumption; Finite difference methods; Frequency domain analysis; Heuristic algorithms; Integrated circuit modeling; Integrated circuit reliability; Performance analysis; Temperature; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5456984
Filename
5456984
Link To Document