DocumentCode
2255099
Title
On component level ESD testing
Author
Soohoo, Kwok M. ; Wu, Chang-Yu
Author_Institution
IBM Corp., Poughkeepsie, NY, USA
fYear
1990
fDate
7-12 Oct. 1990
Firstpage
872
Abstract
The ESD test method proposed involves the use of a transverse electromagnetic (TEM) cell and fiber-optic links to eliminate the unwanted electrostatic discharge (ESD) disturbances to the supportive instrumentation. This limits the ESD transient effects to stress only the common subassembly or component under test and therefore produces the proper susceptibility level for use in predicting the final product ESD performance.<>
Keywords
electrostatic discharge; testing; TEM cell; component level ESD testing; fiber-optic links; supportive instrumentation; susceptibility level; transverse electromagnetic cell; Circuit testing; Costs; Electrostatic discharge; Instruments; Noise level; Noise reduction; Optical fiber testing; Optical fibers; Optical noise; Protection;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location
Seattle, WA, USA
Print_ISBN
0-87942-553-9
Type
conf
DOI
10.1109/IAS.1990.152286
Filename
152286
Link To Document