• DocumentCode
    2255105
  • Title

    A performance comparison on asynchronous matched-delay templates

  • Author

    Chang, Kok-Leong ; Gwee, Bah-Hwee ; Zheng, Yuanjin

  • Author_Institution
    Centre for Integrated Circuits & Syst., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2009
  • fDate
    24-27 May 2009
  • Firstpage
    1008
  • Lastpage
    1011
  • Abstract
    The motivation for asynchronous logic at this juncture of CMOS technology is the issues of power density, process variation and integration limit, where synchronous logic is facing a myriad of problems. Asynchronous templates are the fundamental building blocks of asynchronous circuits and systems, and together with asynchronous EDA tools enable the design of complex systems at a high level of abstraction (similar to the RTL-to-GDSII flow in synchronous design). However, akin to the impact of library cells to the overall system performance in the conventional synchronous flow, the diverse availability of asynchronous template libraries requires prudent contemplation. Therefore in this paper, the most eminent matched-delay asynchronous template families reported to date will be presented, and followed by an in-depth comparison of various design figure of merits (FOMs) - template area, static/dynamic capacity, cycle time, latency, throughput and Et2. The most aggressive template (GasP) can reach a maximum throughput of 5 Giga items/s on 0.13 mum @ 1.2 V.
  • Keywords
    CMOS logic circuits; asynchronous circuits; delays; CMOS technology; asynchronous EDA tool; asynchronous logic; asynchronous matched-delay template; asynchronous template libraries; figure of merit; power density; size 0.13 mum; synchronous logic; voltage 1.2 V; Asynchronous circuits; Availability; CMOS logic circuits; CMOS process; CMOS technology; Delay; Electronic design automation and methodology; Libraries; System performance; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4244-3827-3
  • Electronic_ISBN
    978-1-4244-3828-0
  • Type

    conf

  • DOI
    10.1109/ISCAS.2009.5117929
  • Filename
    5117929