• DocumentCode
    2255191
  • Title

    A self-actuating PZT cantilever integrated with piezoresistor sensor for AFM with high speed parallel operation

  • Author

    Young-Sik Kim ; Hyo-Jin Nam ; Seong-Moon Cho ; Dong-Chun Kim ; Jong-Uk Bu

  • Author_Institution
    Microsystem Group, LG Electron. Inst. of Technol., Seoul, South Korea
  • fYear
    2002
  • fDate
    24-24 Jan. 2002
  • Firstpage
    689
  • Lastpage
    692
  • Abstract
    In this research, we studied the parasitic parameters inducing the electrical coupling between a sensor and PZT actuator using a simple equivalent circuit model of the cantilever with a piezoresistor sensor and PZT actuator. A fully integrated self-actuating PZT cantilever with a piezoresistor has been newly designed, fabricated, and characterized for high speed AFM. The fabricated PZT cantilevers provide 0.55 /spl mu/m/V of high tip displacement and about 5 times lower crosstalk than the previous cantilever structure. The measured resonant frequency was 73 kHz, which is 100 times higher than a conventional piezotube scanner. The piezotube scanner shows creep phenomena at approximately 180 /spl mu/m/sec of scan speed, but the fabricated self-actuating PZT cantilever has a good scanned image at 1 mm/sec.
  • Keywords
    atomic force microscopy; crosstalk; equivalent circuits; image scanners; lead compounds; micromechanical resonators; microsensors; piezoelectric actuators; piezoresistive devices; 73 kHz; PZT; PZT actuator; PbZrO3TiO3; crosstalk; electrical coupling; equivalent circuit model; high speed AFM; high speed parallel operation; high tip displacement; parasitic parameters; piezoresistor sensor; piezotube scanner; resonant frequency; scan speed; scanned image; self-actuating PZT cantilever; Actuators; Atomic force microscopy; Crosstalk; Electrodes; Instruments; Piezoelectric films; Piezoresistance; Sensor phenomena and characterization; Silicon; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7185-2
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2002.984364
  • Filename
    984364