Title :
A self-actuating PZT cantilever integrated with piezoresistor sensor for AFM with high speed parallel operation
Author :
Young-Sik Kim ; Hyo-Jin Nam ; Seong-Moon Cho ; Dong-Chun Kim ; Jong-Uk Bu
Author_Institution :
Microsystem Group, LG Electron. Inst. of Technol., Seoul, South Korea
Abstract :
In this research, we studied the parasitic parameters inducing the electrical coupling between a sensor and PZT actuator using a simple equivalent circuit model of the cantilever with a piezoresistor sensor and PZT actuator. A fully integrated self-actuating PZT cantilever with a piezoresistor has been newly designed, fabricated, and characterized for high speed AFM. The fabricated PZT cantilevers provide 0.55 /spl mu/m/V of high tip displacement and about 5 times lower crosstalk than the previous cantilever structure. The measured resonant frequency was 73 kHz, which is 100 times higher than a conventional piezotube scanner. The piezotube scanner shows creep phenomena at approximately 180 /spl mu/m/sec of scan speed, but the fabricated self-actuating PZT cantilever has a good scanned image at 1 mm/sec.
Keywords :
atomic force microscopy; crosstalk; equivalent circuits; image scanners; lead compounds; micromechanical resonators; microsensors; piezoelectric actuators; piezoresistive devices; 73 kHz; PZT; PZT actuator; PbZrO3TiO3; crosstalk; electrical coupling; equivalent circuit model; high speed AFM; high speed parallel operation; high tip displacement; parasitic parameters; piezoresistor sensor; piezotube scanner; resonant frequency; scan speed; scanned image; self-actuating PZT cantilever; Actuators; Atomic force microscopy; Crosstalk; Electrodes; Instruments; Piezoelectric films; Piezoresistance; Sensor phenomena and characterization; Silicon; Zinc oxide;
Conference_Titel :
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location :
Las Vegas, NV, USA
Print_ISBN :
0-7803-7185-2
DOI :
10.1109/MEMSYS.2002.984364