• DocumentCode
    2255260
  • Title

    Reducing the storage requirements of a test sequence by using a background vector

  • Author

    Pomeranz, Irith ; Reddy, Sudhakar M.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1237
  • Lastpage
    1242
  • Abstract
    We describe a storage scheme for functional test sequences where a test sequence T is associated with a primary input vector B called a background vector. T is stored by storing only the differences between its test vectors and B. We describe a procedure for computing a background vector B for a given test sequence T. We also describe a procedure that modifies T so as to reduce its storage requirements with respect to B. We present experimental results demonstrating that the single background vector B, computed based on T, allows T to be modified such that a vast majority of its entries are equal to the corresponding entries of B. Consequently, storage of T reduces to storage of a small number of entries.
  • Keywords
    digital storage; logic testing; sequential circuits; background vector; functional test sequences; sequential circuits; storage scheme; Circuit simulation; Circuit testing; Cities and towns; Compaction; Encoding; Genetic mutations; Manufacturing; Sequential analysis; Sequential circuits; Synchronous generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5456996
  • Filename
    5456996