• DocumentCode
    2255374
  • Title

    Selective polysilicon deposition for frequency tuning of MEMS resonators

  • Author

    Joachim, D. ; Liwei Lin

  • Author_Institution
    Dept. of Mech. Eng., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2002
  • fDate
    24-24 Jan. 2002
  • Firstpage
    727
  • Lastpage
    730
  • Abstract
    A post-fabrication process was developed to tune the frequency of a set of comb-drive resonators by selectively adding polysilicon to their rotors. Selective deposition was performed by electrically heating the resonators in a silane environment using the same input voltage but varying process times. The resonant frequency of individual devices increased 0.7 to 2%, from an average initial resonant frequency of 86.6 kHz. A correlation between the change in frequency and the location of the newly deposited material was found and verified in a finite element simulation. The data show the percent change in frequency is also dependent on thermal history and initial material properties. This work describes the trends in a new MEMS resonators frequency tuning method.
  • Keywords
    elemental semiconductors; finite element analysis; micromechanical resonators; silicon; tuning; 86.6 kHz; MEMS comb-drive resonator; Si; electrical heating; finite element simulation; frequency tuning; post-fabrication process; resonant frequency; rotor; selective polysilicon deposition; thermal history; Finite element methods; Mechanical engineering; Microcavities; Micromechanical devices; Optical resonators; Resistance heating; Resonant frequency; Temperature; Testing; Tuning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • ISSN
    1084-6999
  • Print_ISBN
    0-7803-7185-2
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2002.984373
  • Filename
    984373