DocumentCode
2255374
Title
Selective polysilicon deposition for frequency tuning of MEMS resonators
Author
Joachim, D. ; Liwei Lin
Author_Institution
Dept. of Mech. Eng., Michigan Univ., Ann Arbor, MI, USA
fYear
2002
fDate
24-24 Jan. 2002
Firstpage
727
Lastpage
730
Abstract
A post-fabrication process was developed to tune the frequency of a set of comb-drive resonators by selectively adding polysilicon to their rotors. Selective deposition was performed by electrically heating the resonators in a silane environment using the same input voltage but varying process times. The resonant frequency of individual devices increased 0.7 to 2%, from an average initial resonant frequency of 86.6 kHz. A correlation between the change in frequency and the location of the newly deposited material was found and verified in a finite element simulation. The data show the percent change in frequency is also dependent on thermal history and initial material properties. This work describes the trends in a new MEMS resonators frequency tuning method.
Keywords
elemental semiconductors; finite element analysis; micromechanical resonators; silicon; tuning; 86.6 kHz; MEMS comb-drive resonator; Si; electrical heating; finite element simulation; frequency tuning; post-fabrication process; resonant frequency; rotor; selective polysilicon deposition; thermal history; Finite element methods; Mechanical engineering; Microcavities; Micromechanical devices; Optical resonators; Resistance heating; Resonant frequency; Temperature; Testing; Tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on
Conference_Location
Las Vegas, NV, USA
ISSN
1084-6999
Print_ISBN
0-7803-7185-2
Type
conf
DOI
10.1109/MEMSYS.2002.984373
Filename
984373
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