DocumentCode
2255431
Title
Efficient representation, stratification, and compression of variational CSM library waveforms using Robust Principle Component Analysis
Author
Hatami, Safar ; Pedram, Massoud
Author_Institution
Dept. of Electr. Eng., Univ. of Southern California, Los Angeles, CA, USA
fYear
2010
fDate
8-12 March 2010
Firstpage
1285
Lastpage
1290
Abstract
In deep sub-micron technology, accurate modeling of output waveforms of library cells under different input slew and load capacitance values is crucial for precise timing and noise analysis of VLSI circuits. Construction of a compact and efficient model of such waveforms becomes even more challenging when manufacturing process and environmental variations are considered. This paper introduces a rigorous and robust foundation to mathematically model output waveforms under sources of variability and to compress the library data. The proposed approach is suitable for today´s current source model (CSM) based ASIC libraries. It employs an orthonormal transformation to represent the output waveforms as a linear combination of some appropriately-derived basis waveforms. More significantly Robust Principle Component Analysis (RPCA) is used to stratify the library waveforms into a small number of groups for which different sets of principle components are calculated. This stratification results in a very high compression ratio for the variational CSM library while meeting a maximum error tolerance. Interpolation and further compression is obtained by representing the coefficients as signomial functions of various parameters, e.g., input slew, load capacitance, supply voltage, and temperature. We propose a procedure to calculate the coefficients and power of the signomial functions. Experimental results demonstrate the effectiveness of the proposed variational CSM modeling framework and the stratification-based compression approach.
Keywords
VLSI; integrated circuit design; interpolation; principal component analysis; ASIC libraries; VLSI circuits; current source model; deep submicron technology; environmental variations; interpolation; manufacturing process; maximum error tolerance; noise analysis; robust principle component analysis; signomial functions; stratification-based compression approach; variational CSM library waveform compression; Capacitance; Circuit analysis; Circuit noise; Libraries; Manufacturing processes; Mathematical model; Noise robustness; Timing; Very large scale integration; Working environment noise; Current Source Model; Robust Principle Component Analysis; Stratification; signomial;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457004
Filename
5457004
Link To Document