DocumentCode :
2255493
Title :
Modeling of electronic transport in metallic carbon nanotube interconnects
Author :
Parkash, Vidur ; Goel, Ashok K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan Technol. Univ., Houghton, MI, USA
fYear :
2010
fDate :
19-22 Dec. 2010
Firstpage :
244
Lastpage :
247
Abstract :
Metallic carbon nanotubes are being considered as a candidate for to potentially replace Copper as an interconnect material in future generation integrated circuits. In this paper we examine electronic transport behavior in metallic carbon nanotubes using a self consistent non equilibrium Green´s function (NEGF) methodolgy including effects of electron phonon interactions Results show that conductivity is seen to decrease in the ballistic limit due to localized disorder effects even with a weak disorder potential. We were also able to show that optical phonons (LO/TO modes) are the dominant mechanisms that govern the mean free path of conduction. Our calculations show an excellent match with experiement.
Keywords :
Green´s function methods; carbon nanotubes; electron-phonon interactions; integrated circuit interconnections; C; ballistic limit; conductivity; copper; electron phonon interaction; electronic transport behavior; integrated circuit; interconnect material; localized disorder; metallic carbon nanotube interconnects; non equilibrium Green´s function; optical phonon; weak disorder potential; Carbon nanotubes; nanotechnology; non equilibrium Green´s functions; phonons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics (ICM), 2010 International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-61284-149-6
Type :
conf
DOI :
10.1109/ICM.2010.5696128
Filename :
5696128
Link To Document :
بازگشت