• DocumentCode
    2255497
  • Title

    Computational intelligence-based testing for noise and robustness analysis

  • Author

    Liau, Eric ; Menke, Manfred ; Janik, Thoma ; Schmitt-Landsiedel, Doris

  • fYear
    2005
  • fDate
    20-22 July 2005
  • Firstpage
    279
  • Lastpage
    284
  • Keywords
    Circuit noise; Competitive intelligence; Computational intelligence; Frequency; Inductance; Magnetic noise; Noise figure; Noise robustness; Power supplies; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence for Measurement Systems and Applications, 2005. CIMSA. 2005 IEEE International Conference on
  • Print_ISBN
    0-7803-9026-1
  • Type

    conf

  • DOI
    10.1109/CIMSA.2005.1522878
  • Filename
    1522878
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2255497