DocumentCode :
2255497
Title :
Computational intelligence-based testing for noise and robustness analysis
Author :
Liau, Eric ; Menke, Manfred ; Janik, Thoma ; Schmitt-Landsiedel, Doris
fYear :
2005
fDate :
20-22 July 2005
Firstpage :
279
Lastpage :
284
Keywords :
Circuit noise; Competitive intelligence; Computational intelligence; Frequency; Inductance; Magnetic noise; Noise figure; Noise robustness; Power supplies; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence for Measurement Systems and Applications, 2005. CIMSA. 2005 IEEE International Conference on
Print_ISBN :
0-7803-9026-1
Type :
conf
DOI :
10.1109/CIMSA.2005.1522878
Filename :
1522878
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2255497
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