Title :
Semiconductor nanostructures in crystalline rare earth oxide for nanoelectronic device applications
Author :
Laha, Apurba ; Bugiel, E. ; Ranjith, R. ; Osten, H.J. ; Fissel, Andreas ; Afanas´ev, V.V. ; Badylevich, M.
Author_Institution :
Inst. of Electron. Mater. & Devices, Leibniz Univ., Hannover, Germany
Abstract :
In this paper, we will demonstrate a novel approach to incorporate Si and/or Ge nanostructures into crystalline rare earth oxides using molecular beam epitaxy (MBE) for nanoelectronic devices application. By efficiently exploiting the growth kinetics during MBE we succeeded in creating semiconductor nanostructures exhibiting various dimensions, ranging from three dimensionally confined quantum dots (QDs) to the quantum wells, where the particles are confined in one dimension. The crystalline rare earth oxide that has been used in this study is the epitaxial gadolinium oxide (Gd2O3). The monolithic heterostructures comprised of Gd2O3-Ge/Si-Gd2O3 grown on Si substrate exhibit excellent crystalline quality with atomically sharp interface.
Keywords :
crystal structure; epitaxial growth; gadolinium compounds; germanium compounds; molecular beam epitaxial growth; nanoelectronics; nanostructured materials; semiconductor quantum dots; semiconductor quantum wells; silicon compounds; Gd2O3:Ge; MBE; QD; Si:Gd2O3; atomically sharp interface; confined quantum dots; crystalline quality; crystalline rare earth oxide; epitaxial gadolinium oxide; growth kinetics; molecular beam epitaxy; monolithic heterostructures; nanoelectronic device applications; quantum wells; semiconductor nanostructures; Atomic layer deposition; Atomic measurements; Epitaxial growth; Optical imaging; Optical refraction; Performance evaluation; Silicon; Semiconductor nanostructure; molecular beam epitaxy; quantum dot memories; rare earth oxide;
Conference_Titel :
Microelectronics (ICM), 2010 International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-61284-149-6
DOI :
10.1109/ICM.2010.5696129