Title :
OCT imaging up to 760 kHz axial scan rate using single-mode 1310nm MEMS-tunable VCSELs with >100nm tuning range
Author :
Jayaraman, V. ; Jiang, J. ; Li, H. ; Heim, P.J.S. ; Cole, G.D. ; Potsaid, B. ; Fujimoto, J.G. ; Cable, A.
Abstract :
We describe the first widely tunable, single-mode 1310nm MEMS VCSELs with >;100nm tuning range, and the first application of these VCSELs to ultra-high-speed swept source OCT imaging at axial scan rates up to 760kHz.
Keywords :
high-speed optical techniques; laser tuning; micromechanical devices; optical tomography; surface emitting lasers; OCT imaging; axial scan rate; frequency 760 kHz; microelectromechanical systems; optical coherence tomography; single-mode MEMS-tunable VCSEL; vertical cavity surface emitting lasers; wavelength 100 nm; wavelength 1310 nm; Coherence; Imaging; Laser tuning; Mirrors; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4577-1223-4
