DocumentCode
2255514
Title
OCT imaging up to 760 kHz axial scan rate using single-mode 1310nm MEMS-tunable VCSELs with >100nm tuning range
Author
Jayaraman, V. ; Jiang, J. ; Li, H. ; Heim, P.J.S. ; Cole, G.D. ; Potsaid, B. ; Fujimoto, J.G. ; Cable, A.
fYear
2011
fDate
1-6 May 2011
Firstpage
1
Lastpage
2
Abstract
We describe the first widely tunable, single-mode 1310nm MEMS VCSELs with >;100nm tuning range, and the first application of these VCSELs to ultra-high-speed swept source OCT imaging at axial scan rates up to 760kHz.
Keywords
high-speed optical techniques; laser tuning; micromechanical devices; optical tomography; surface emitting lasers; OCT imaging; axial scan rate; frequency 760 kHz; microelectromechanical systems; optical coherence tomography; single-mode MEMS-tunable VCSEL; vertical cavity surface emitting lasers; wavelength 100 nm; wavelength 1310 nm; Coherence; Imaging; Laser tuning; Mirrors; Vertical cavity surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2011 Conference on
Conference_Location
Baltimore, MD
Print_ISBN
978-1-4577-1223-4
Type
conf
Filename
5951253
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