DocumentCode
2255541
Title
Engineering data analysis using Discovery [semiconductor manufacture]
Author
Fowler, Leslie ; Davis, Tony
Author_Institution
Motorola Inc., USA
fYear
1996
fDate
12-14 Nov 1996
Firstpage
416
Lastpage
422
Abstract
The ability to rapidly turn data into information is a necessity in the semiconductor industry. Furthermore, the ability to analyze and correlate yield results to electrical test results and in-process data is essential in the overall yield enhancement effort. The need exists to have a centralized database to store all aspects of engineering data, and analysis tools that will communicate with the database. KLA obtained the rights to Motorola´s engineering database (Synergy) and analysis software (EDASTM) and now markets it as DiscoveryTM. The Discovery system provides the capability of storing all probe results, in-process, equipment and SPC data, as well as bitmap and defect die level summary information. In addition, EDAS provides basic analytical software capabilities specifically for the semiconductor industry. MOS-13 and KLA partnered in the installation of Discovery into Motorola´s newest fab, MOS-13. The goal was to implement an engineering database and analysis system to provide engineering with centralized access to needed data and analytical software that would assist them in their needs. Electrical test, and Probe bin, characterization, and bitmap die level summary data are currently being loaded into the Discovery database. The Discovery database, EDAS, and a newly created reporting tool have become an essential part of MOS-13
Keywords
data analysis; database management systems; electronic engineering computing; integrated circuit manufacture; integrated circuit yield; manufacturing data processing; production engineering computing; semiconductor device manufacture; Discovery database system; EDAS analysis software; KLA; MOS-13 fab; Motorola engineering database; SPC data; Synergy; bitmap level summary information; centralized database; defect die level summary information; electrical test results; engineering data analysis; equipment data; in-process data; semiconductor industry; yield enhancement; yield results; Application software; Data analysis; Data engineering; Data mining; Databases; Electronic design automation and methodology; Instruments; Probes; Semiconductor device manufacture; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-3371-3
Type
conf
DOI
10.1109/ASMC.1996.558100
Filename
558100
Link To Document