• DocumentCode
    2255541
  • Title

    Engineering data analysis using Discovery [semiconductor manufacture]

  • Author

    Fowler, Leslie ; Davis, Tony

  • Author_Institution
    Motorola Inc., USA
  • fYear
    1996
  • fDate
    12-14 Nov 1996
  • Firstpage
    416
  • Lastpage
    422
  • Abstract
    The ability to rapidly turn data into information is a necessity in the semiconductor industry. Furthermore, the ability to analyze and correlate yield results to electrical test results and in-process data is essential in the overall yield enhancement effort. The need exists to have a centralized database to store all aspects of engineering data, and analysis tools that will communicate with the database. KLA obtained the rights to Motorola´s engineering database (Synergy) and analysis software (EDASTM) and now markets it as DiscoveryTM. The Discovery system provides the capability of storing all probe results, in-process, equipment and SPC data, as well as bitmap and defect die level summary information. In addition, EDAS provides basic analytical software capabilities specifically for the semiconductor industry. MOS-13 and KLA partnered in the installation of Discovery into Motorola´s newest fab, MOS-13. The goal was to implement an engineering database and analysis system to provide engineering with centralized access to needed data and analytical software that would assist them in their needs. Electrical test, and Probe bin, characterization, and bitmap die level summary data are currently being loaded into the Discovery database. The Discovery database, EDAS, and a newly created reporting tool have become an essential part of MOS-13
  • Keywords
    data analysis; database management systems; electronic engineering computing; integrated circuit manufacture; integrated circuit yield; manufacturing data processing; production engineering computing; semiconductor device manufacture; Discovery database system; EDAS analysis software; KLA; MOS-13 fab; Motorola engineering database; SPC data; Synergy; bitmap level summary information; centralized database; defect die level summary information; electrical test results; engineering data analysis; equipment data; in-process data; semiconductor industry; yield enhancement; yield results; Application software; Data analysis; Data engineering; Data mining; Databases; Electronic design automation and methodology; Instruments; Probes; Semiconductor device manufacture; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference and Workshop, 1996. ASMC 96 Proceedings. IEEE/SEMI 1996
  • Conference_Location
    Cambridge, MA
  • ISSN
    1078-8743
  • Print_ISBN
    0-7803-3371-3
  • Type

    conf

  • DOI
    10.1109/ASMC.1996.558100
  • Filename
    558100