DocumentCode
2255640
Title
Environmental impact and design parameters in electronics manufacturing-a sensitivity analysis approach
Author
Siddhaye, Sudarshan ; Sheng, Paul
Author_Institution
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
fYear
2000
fDate
2000
Firstpage
39
Lastpage
45
Abstract
Environmental factors have become an increasingly important issue in the design of electronic products. Factors such as recyclability and product end-of-life, latent human hazards and physical hazards have migrated from secondary constraints to become integral design objectives. However the extent to which design levers can be used to meet these objectives is often unknown, since there can be many interactions taking place during the design process. One method for determining environmental sensitivity is through a multi-layered influence diagram, which maps the influence of primary design parameters to product characteristic variables, waste variables and hazard variables. The influence diagram framework is coupled with process relationships between layers and variable space constraints to form a sensitivity analysis. This approach has been shown to be effective in conveying hazard relationships to key assembly design parameters. A case example of design sensitivity to waste variables for printed circuit board assembly (PCBA) is presented
Keywords
assembling; design for environment; printed circuit manufacture; product development; sensitivity analysis; design parameters; electronic products design; electronics manufacturing; environmental impact; latent human hazards; multi-layered influence diagram; physical hazards; primary design parameters; printed circuit board assembly; product end-of-life; recyclability; sensitivity analysis; waste variables; Assembly; Environmental factors; Hazards; Humans; Manufacturing; Mechanical engineering; Process design; Product design; Sensitivity analysis; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and the Environment, 2000. ISEE 2000. Proceedings of the 2000 IEEE International Symposium on
Conference_Location
San Francisco, CA
ISSN
1095-2020
Print_ISBN
0-7803-5962-3
Type
conf
DOI
10.1109/ISEE.2000.857623
Filename
857623
Link To Document