DocumentCode
2255704
Title
Built-in-current-sensor for testing short and open faults in CMOS digital circuits
Author
Ahmed, R.F. ; Radwan, A.G. ; Madian, A.H. ; Soliman, A.M.
Author_Institution
Dept. of Electr. Eng., Fayoum Univ., Fayoum, Egypt
fYear
2010
fDate
19-22 Dec. 2010
Firstpage
276
Lastpage
279
Abstract
In this paper, a novel built-in sensor (BIS) for digital CMOS circuit testing has been proposed. The proposed BIS has no voltage degradation and it is able to detect, identify and localize both open and short circuit faults. Moreover, it has a simple realization with very small area and detection time. A 4×4 multiplier cell is tested by the proposed BIS and all injected faults are detected.
Keywords
CMOS digital integrated circuits; built-in self test; fault diagnosis; integrated circuit testing; CMOS digital circuits; built-in sensor; built-in-current-sensor; digital CMOS circuit testing; fault testing; multiplier cell; open circuit faults; short circuit faults; voltage degradation; Adders; CMOS integrated circuits; Circuit faults; Integrated circuit modeling; MOS devices; Sensors; Testing; Built In Sensors; Digital system; catastrophic fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2010 International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-61284-149-6
Type
conf
DOI
10.1109/ICM.2010.5696137
Filename
5696137
Link To Document