Title :
Built-in-current-sensor for testing short and open faults in CMOS digital circuits
Author :
Ahmed, R.F. ; Radwan, A.G. ; Madian, A.H. ; Soliman, A.M.
Author_Institution :
Dept. of Electr. Eng., Fayoum Univ., Fayoum, Egypt
Abstract :
In this paper, a novel built-in sensor (BIS) for digital CMOS circuit testing has been proposed. The proposed BIS has no voltage degradation and it is able to detect, identify and localize both open and short circuit faults. Moreover, it has a simple realization with very small area and detection time. A 4×4 multiplier cell is tested by the proposed BIS and all injected faults are detected.
Keywords :
CMOS digital integrated circuits; built-in self test; fault diagnosis; integrated circuit testing; CMOS digital circuits; built-in sensor; built-in-current-sensor; digital CMOS circuit testing; fault testing; multiplier cell; open circuit faults; short circuit faults; voltage degradation; Adders; CMOS integrated circuits; Circuit faults; Integrated circuit modeling; MOS devices; Sensors; Testing; Built In Sensors; Digital system; catastrophic fault diagnosis;
Conference_Titel :
Microelectronics (ICM), 2010 International Conference on
Conference_Location :
Cairo
Print_ISBN :
978-1-61284-149-6
DOI :
10.1109/ICM.2010.5696137
