• DocumentCode
    2255873
  • Title

    Optimization of the bias current network for accurate on-chip thermal monitoring

  • Author

    Long, Jieyi ; Memik, Seda Ogrenci

  • Author_Institution
    Dept. of EECS, Northwestern Univ., Evanston, IL, USA
  • fYear
    2010
  • fDate
    8-12 March 2010
  • Firstpage
    1365
  • Lastpage
    1368
  • Abstract
    Microprocessor chips employ increasingly larger number of thermal sensing devices. These devices are networked by an underlying infrastructure, which provides bias currents to sensing devices and collects measurements. In this work, we address the optimization of the bias current distribution network utilized by the sensing devices. We show that the choice between two fundamental topologies (the 2-wire and the 4-wire measurement) for this network has a non-negligible impact on the precision of the monitoring system. We also show that the 4-wire measurement principle supports the remote sensing technique better. However, it requires more routing resources. We thus propose a novel routing algorithm to minimize its routing cost. We also present a detailed evaluation of the quality of the resulting system in presence of process and thermal variations. Our Monte Carlo simulations using the IBM 10SF 65 nm SPICE models show that the monitoring accuracies can be as high as 0.6??C under considerable amount of process and temperature variation. Moreover, by adopting a customized routing approach for the current mirror network, the total wire length of the bias current network can be reduced by as much as 42.74% and by 27.65% on average.
  • Keywords
    Monte Carlo methods; SPICE; distribution networks; microprocessor chips; optimisation; temperature measurement; temperature sensors; 4-wire measurement principle; IBM 10SF SPICE models; Monte Carlo simulations; bias current distribution network; microprocessor chips; on-chip thermal monitoring; optimization; remote sensing; routing resources; size 65 nm; thermal sensing devices; Costs; Current distribution; Current measurement; Microprocessor chips; Network topology; Network-on-a-chip; Remote monitoring; Routing; SPICE; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
  • Conference_Location
    Dresden
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4244-7054-9
  • Type

    conf

  • DOI
    10.1109/DATE.2010.5457023
  • Filename
    5457023