DocumentCode
2255873
Title
Optimization of the bias current network for accurate on-chip thermal monitoring
Author
Long, Jieyi ; Memik, Seda Ogrenci
Author_Institution
Dept. of EECS, Northwestern Univ., Evanston, IL, USA
fYear
2010
fDate
8-12 March 2010
Firstpage
1365
Lastpage
1368
Abstract
Microprocessor chips employ increasingly larger number of thermal sensing devices. These devices are networked by an underlying infrastructure, which provides bias currents to sensing devices and collects measurements. In this work, we address the optimization of the bias current distribution network utilized by the sensing devices. We show that the choice between two fundamental topologies (the 2-wire and the 4-wire measurement) for this network has a non-negligible impact on the precision of the monitoring system. We also show that the 4-wire measurement principle supports the remote sensing technique better. However, it requires more routing resources. We thus propose a novel routing algorithm to minimize its routing cost. We also present a detailed evaluation of the quality of the resulting system in presence of process and thermal variations. Our Monte Carlo simulations using the IBM 10SF 65 nm SPICE models show that the monitoring accuracies can be as high as 0.6??C under considerable amount of process and temperature variation. Moreover, by adopting a customized routing approach for the current mirror network, the total wire length of the bias current network can be reduced by as much as 42.74% and by 27.65% on average.
Keywords
Monte Carlo methods; SPICE; distribution networks; microprocessor chips; optimisation; temperature measurement; temperature sensors; 4-wire measurement principle; IBM 10SF SPICE models; Monte Carlo simulations; bias current distribution network; microprocessor chips; on-chip thermal monitoring; optimization; remote sensing; routing resources; size 65 nm; thermal sensing devices; Costs; Current distribution; Current measurement; Microprocessor chips; Network topology; Network-on-a-chip; Remote monitoring; Routing; SPICE; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457023
Filename
5457023
Link To Document