• DocumentCode
    2255934
  • Title

    Ecodesign innovation: is `early´ always `best´?

  • Author

    Sherwin, Chris ; Evans, Professor Stephen

  • Author_Institution
    Eco Innovations Group, Cranfield Univ., UK
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    112
  • Lastpage
    117
  • Abstract
    This paper explores ecodesign within the product development process (PDP), particularly focusing on the design stages. Previous research has highlighted the early stages as the `best´ place to integrate environmental issues. Here the early stage hypothesis is explored from the perspective of the industrial design department-the early stage designers. Being located at the earliest possible design stages of product development would mean that, were the hypothesis to hold true, industrial design world be the `best´ place to locate ecodesign. Empirical research was conducted with the Industrial Design Centre (IDC) of a global Electrical and Electronic goods manufacture. It used a qualitative, inductive research methodology, based on two `live´ design concept projects, participant observation within the department and on several semi-structured interviews. Throughout this paper, the empirical work is compared and contrasted to ecodesign literature, specifically to models of ecodesign innovation and the product development process. Beginning by exploring of the early stage hypothesis, the paper concludes with a conceptual model of early stage ecodesign for the context in question
  • Keywords
    design for environment; electronics industry; manufacture; product development; early stage design; ecodesign innovation; electrical goods manufacture; electronic goods manufacture; environmental issues; industrial design; product development process; Companies; Costs; Product design; Product development; Production; Technological innovation; Time measurement; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics and the Environment, 2000. ISEE 2000. Proceedings of the 2000 IEEE International Symposium on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1095-2020
  • Print_ISBN
    0-7803-5962-3
  • Type

    conf

  • DOI
    10.1109/ISEE.2000.857634
  • Filename
    857634