DocumentCode :
2256199
Title :
Scoped identifiers for efficient bit aligned logging
Author :
Shea, Roy ; Srivastava, Mani ; Cho, Young
Author_Institution :
Comput. Sci. Dept., Univ. of California Los Angeles, Los Angeles, CA, USA
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
1450
Lastpage :
1455
Abstract :
Detailed diagnostic data is a prerequisite for debugging problems and understanding runtime performance in distributed wireless embedded systems. Severe bandwidth limitations, tight timing constraints, and limited program text space hinder the application of standard diagnostic tools within this domain. This work introduces the Log Instrumentation Specification (LIS), which provides a high level logging interface to developers and is able to create extremely compact diagnostic logs. LIS uses a token scoping technique to aggressively compact identifiers that are packed into bit aligned log buffers. LIS is evaluated in the context of recording call traces within a network of wireless sensor nodes. Our evaluation shows that logs generated using LIS require less than 50% of the bandwidth utilized by alternate logging mechanisms. Through microbench-marking of a complete LIS implementation for the TinyOS operating system, we demonstrate that LIS can comfortably fit onto low-end embedded systems. By significantly reducing log bandwidth, LIS enables extraction of a more complete picture of runtime behavior from distributed wireless embedded systems.
Keywords :
embedded systems; operating systems (computers); program debugging; program diagnostics; wireless sensor networks; LIS; TinyOS operating system; bandwidth limitations; debugging problems; detailed diagnostic data; distributed wireless embedded systems; efficient bit aligned logging; logging interface; scoped identifiers; wireless sensor nodes; Bandwidth; Computer science; Debugging; Distributed computing; Embedded computing; Embedded system; Encoding; Instruments; Runtime; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457040
Filename :
5457040
Link To Document :
بازگشت