DocumentCode
2256643
Title
Measurement of mid-infrared alinsb light-emitting diodes with surface patterning
Author
Buss, I.J. ; Mirza, B.I. ; Nash, G.R. ; Storey, C. ; Buckle, L. ; Coomber, S.D. ; Emeny, M.T. ; Rarity, J.G. ; Cryan, M.J.
Author_Institution
Dept. of Electron. & Electr. Eng., Bristol Univ., Bristol
fYear
2008
fDate
4-9 May 2008
Firstpage
1
Lastpage
2
Abstract
3D FDTD modelling is employed to design a surface pattern for mid-IR LEDs. Measured enhancement factors over an un-patterned device of 8% and 14% are found at 300 K and 25 K respectively.
Keywords
III-V semiconductors; aluminium compounds; indium compounds; light emitting diodes; AlInSb; enhancement factors; finite difference time-domain modelling; mid-infrared light-emitting diodes; surface pattern; temperature 25 K; temperature 300 K; Etching; Finite difference methods; Fresnel reflection; Gratings; Light emitting diodes; Lithography; Optical devices; Optical surface waves; Pulse modulation; Time domain analysis; (230.3670) Light-emitting diodes; (240.5770) Roughness;
fLanguage
English
Publisher
iet
Conference_Titel
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-859-9
Type
conf
Filename
4572349
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