DocumentCode
2257105
Title
ENOB calculation for ADCs with input-correlated quantization error using a sine-wave test
Author
Weaver, Skyler ; Hershberg, Benjamin ; Moon, Un-Ku
Author_Institution
Sch. of EECS, Oregon State Univ., Corvallis, OR, USA
fYear
2010
fDate
19-22 Dec. 2010
Firstpage
5
Lastpage
8
Abstract
The equation for calculating ENOB from SNDR of a sine-wave test is only accurate when noise is uncorrelated to the input. In this paper, the equation for calculating ENOB from SNDR is derived for an ideal and a uniform stochastic ADC. The result of these derivations shows that calculating ENOB from SNDR using the conventional equation causes a better-than-actual result in the case a uniform stochastic ADC.
Keywords
analogue-digital conversion; ENOB calculation; input-correlated quantization error; sine-wave test; uniform stochastic ADC; Equations; Mathematical model; Probability density function; Quantization; Random variables; Signal to noise ratio;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (ICM), 2010 International Conference on
Conference_Location
Cairo
Print_ISBN
978-1-61284-149-6
Type
conf
DOI
10.1109/ICM.2010.5696205
Filename
5696205
Link To Document