DocumentCode :
2257336
Title :
Ultrafast carrier trapping in high energy ion implanted indium phosphide
Author :
Camody, C. ; Boudinov, H. ; Tan, H.H. ; Jagadish, C. ; Dao, L.V. ; Gal, M.
Author_Institution :
The Australian National University
fYear :
2002
fDate :
30 June-5 July 2002
Firstpage :
221
Lastpage :
224
Keywords :
Annealing; Conductivity; Gallium; Indium phosphide; Laser mode locking; Performance evaluation; Power engineering and energy; Solid lasers; Temperature; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconducting and Insulating Materials, 2002. SIMC-XII-2002. 12th International Conference on
Print_ISBN :
0-7803-7418-5
Type :
conf
DOI :
10.1109/SIM.2002.1242760
Filename :
1242760
Link To Document :
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