DocumentCode :
2257443
Title :
A 14 bit, 280 kS/s cyclic ADC with 100 dB SFDR
Author :
Froehlich, Thomas ; Sharma, Vivek ; Bingesser, Markus
Author_Institution :
Austriamicrosystems Switzerland AG, Rapperswil, Switzerland
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
706
Lastpage :
710
Abstract :
This paper presents the design of a 14 bit, 280 kS/s cyclic ADC which consumes 1.6 mW power and achieves 100 dB SFDR. The design is optimized with a half-scale residue transfer characteristic (RTC) which lowers swing and slew requirements on the opamp. Further advantages of this RTC are exploited to reduce the number and magnitude of dominant error sources, and the residual error is randomized with dithering. Capacitor scaling and optimized allocation of conversion time to each step add to power savings. The ADC fabricated in a 0.35 ??m CMOS process occupies 1.04 mm2 silicon area.
Keywords :
analogue-digital conversion; integrated circuit design; CMOS process; SFDR; analog-to-digital converter; capacitor scaling; conversion time; cyclic ADC; differential nonlinearity; dithering; half-scale residue transfer characteristic; integral nonlinearity; optimized allocation; residual error; Adders; Analog-digital conversion; CMOS process; Capacitors; Design optimization; Differential amplifiers; Energy consumption; Linearity; Noise reduction; Silicon; Cyclic analog-to-digital converter (ADC); differential nonlinearity (DNL); dithering; half-scale residue transfer characteristic (RTC); integral nonlinearity (INL); residue amplifier (RA);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457109
Filename :
5457109
Link To Document :
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