Title :
Innovation to overcome limitations of test equipment
Author :
Wegener, Carsten ; Kennedy, Michael Peter
Author_Institution :
Dept. of Microelectron. Eng., Cork Univ. Coll., Ireland
fDate :
28 Aug.-2 Sept. 2005
Abstract :
In this contribution, we describe current developments in the automatic test equipment (ATE) industry with respect to the hardware and software. For testing mixed-signal interface devices, such as digital-to-analog and analog-to-digital converters (DACs and ADCs) the standard test setups are examined. In particular, limitations are identified that lead to exponentially increasing test time for high-resolution converters. Examples of innovative approaches to keep this test cost increase at bay are outlined.
Keywords :
analogue-digital conversion; automatic test equipment; design for testability; digital-analogue conversion; analog-to-digital converters; automatic test equipment; digital-to-analog converters; high-resolution converters; mixed-signal interface device testing; Circuit testing; Clocks; Costs; Degradation; Design for testability; Digital circuits; Microelectronics; Radio frequency; Technological innovation; Test equipment;
Conference_Titel :
Circuit Theory and Design, 2005. Proceedings of the 2005 European Conference on
Print_ISBN :
0-7803-9066-0
DOI :
10.1109/ECCTD.2005.1522972
