• DocumentCode
    2257804
  • Title

    Novel memory organization and circuit designs for efficient data access in applications of 3D graphics and multimedia coding

  • Author

    Hsiao, Shen-Fu ; Chen, Yo-Chi ; Tsai, Ming-Yu ; Cheng, Tze-Chong

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Nat. Sun Yat-sen Univ., Kaohsiung
  • fYear
    2006
  • fDate
    2-4 Aug. 2006
  • Lastpage
    42
  • Abstract
    Memory has become one of the critical components in many applications. This paper presents new designs of SRAM memory circuit and architectures for applications in 3D graphics, JPEG2000, and multimedia codec. In the 3D graphics pipeline, the memory initialization is realized by modifying the circuits in the SRAM decoder and storage cell. In the bit-plane coder (BPC) of JPEG2000, we propose a new 3D memory architecture design and the corresponding circuit designs for efficient data access in processing the stripe-based bit planes. The 3D memory design can be also applied to the design of parallel-in-parallel-out transpose memory that is frequently encountered in the design of 2D DCT in JPEG and MPEG codec. We also develop a memory generator to allow for easy generation of the application-specific memory units of various sizes to be embedded in conventional cell-based design flow
  • Keywords
    SRAM chips; application specific integrated circuits; codecs; integrated circuit design; logic design; memory architecture; multimedia systems; 3D graphics; 3D memory architecture design; JPEG2000; SRAM decoder; SRAM memory circuit; application-specific memory units; bit-plane coder; data access; memory initialization; memory organization; multimedia codec; multimedia coding; parallel-in-parallel-out transpose memory; storage cell; Application software; CMOS logic circuits; Circuit synthesis; Codecs; Computer graphics; Decoding; Discrete cosine transforms; Memory architecture; Pipelines; Random access memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2006. MTDT '06. 2006 IEEE International Workshop on
  • Conference_Location
    Taipei
  • ISSN
    1087-4852
  • Print_ISBN
    0-7695-2572-5
  • Type

    conf

  • DOI
    10.1109/MTDT.2006.22
  • Filename
    1654578