• DocumentCode
    2257908
  • Title

    Very high quality p-type AlxGa1-xN/GaN superlattice

  • Author

    Yasan, Alireza ; Razeghi, Manijeh

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    389
  • Lastpage
    390
  • Abstract
    Very high quality p-type AlGaN/GaN superlattices have been achieved through optimization of Mg flow and period of superlattice. A theoretical model was used to predict the performance of superlattice with different Al compositions and various periods. The model has based on polarization charge induced by spontaneous polarization and piezoelectric effect (due to lattice mismatch and thermal strain) which leads to enhancement in acceptor ionization and therefore carrier concentration. Piezoelectric coefficients for GaN system are about one order of magnitude larger than other group III-V semiconductors leading to a huge electric field
  • Keywords
    III-V semiconductors; aluminium compounds; carrier density; dielectric polarisation; gallium compounds; piezoelectric semiconductors; semiconductor superlattices; AlGaN-GaN; acceptor ionization; carrier concentration; huge electric field; lattice mismatch; piezoelectric effect; polarization charge; spontaneous polarization; thermal strain; very high quality p-type AlxGa1-xN/GaN superlattice performance; Aluminum gallium nitride; Capacitive sensors; Gallium nitride; III-V semiconductor materials; Ionization; Lattices; Piezoelectric effect; Piezoelectric polarization; Predictive models; Superlattices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2001 International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7432-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2001.984525
  • Filename
    984525