Title :
Dual-Vth leakage reduction with Fast Clock Skew Scheduling Enhancement
Author :
Tie, Meng ; Dong, Haiying ; Wang, Tong ; Cheng, Xu
Author_Institution :
Micro Processor R&D Center, Peking Univ., Beijing, China
Abstract :
Dual-Vth technique is a mature and effective method for reducing leakage power consumption. Previously proposed algorithms assign logic gates with sufficient timing slack to high threshold voltage to reduce leakage power without impact on timing. Meanwhile, clock skew scheduling algorithms are always utilized to optimize period or timing slack. In order to further reduce subthreshold leakage power consumption, in this paper, we ingeniously combine dual voltage assignment technique with intended clock skew scheduling: First, a leakage weight based clock skew scheduling algorithm is proposed to enlarge the leakage power optimization potential. Then we employ a dual-threshold voltage assignment algorithm to minimize leakage power. The experimental results on ISCAS89 benchmark circuits show that, within only several seconds, the leakage power can be further reduced by as much as 41.30% and by 9.87% on average with this new approach, compared to using the traditional method without considering clock skews. Three timing optimized industrial circuit blocks, among which each has around one hundred thousand gates, have also been optimized. It is shown that an average leakage power reduction of 9.95% can be achieved within minutes compared with traditional techniques.
Keywords :
clocks; flip-flops; power consumption; threshold logic; timing circuits; dual-Vth leakage reduction; dual-threshold voltage assignment; fast clock skew scheduling enhancement; flip-flop; leakage power optimization; leakage power reduction; leakage weight; period slack; subthreshold leakage power consumption; timing optimized industrial circuit block; timing slack; Circuits; Clocks; Delay; Energy consumption; Flip-flops; Job shop scheduling; Processor scheduling; Scheduling algorithm; Timing; Voltage; clock skew; dual-threshold; leakage; low power;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
Print_ISBN :
978-1-4244-7054-9
DOI :
10.1109/DATE.2010.5457149