• DocumentCode
    2258229
  • Title

    Investigation of fracture behaviors of Cu-Sn intermetallics using impact test

  • Author

    Chaoran Yang ; Lee, S. W. Ricky

  • Author_Institution
    Dept. of Mech. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong, China
  • fYear
    2012
  • fDate
    10-12 Dec. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    It is well known that high temperature thermal aging can increase the thickness of the IMC layer of a solder joint and, consequently, the mechanical strength of the solder joint is reduced. Yet there is still no conclusive explanation that can answer the question why the growth of IMC layer can reduce the strength of solder joints. In this study, the fracture energies of the Cu-Sn IMC layer after various periods of thermal aging were compared using the impact test method. Detailed fractographic analysis was also performed. In addition, the brittle failure of solder joints under high speed ball pull tests was analyzed for comparison.
  • Keywords
    brittle fracture; copper alloys; fractography; impact testing; mechanical strength; tin alloys; CuSn; IMC layer; brittle failure; fractographic analysis; fracture behaviors; fracture energy; high temperature thermal aging; impact test method; intermetallics; mechanical strength; solder joint;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    CPMT Symposium Japan, 2012 2nd IEEE
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4673-2654-4
  • Type

    conf

  • DOI
    10.1109/ICSJ.2012.6523420
  • Filename
    6523420