DocumentCode :
2258272
Title :
A power optimization method for CMOS Op-Amps using sub-space based geometric programming
Author :
Gao, Wei ; Hornsey, Richard
Author_Institution :
Comput. Sci. & Eng. Dept., York Univ., Toronto, ON, Canada
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
508
Lastpage :
513
Abstract :
A new sub-space max-monomial modeling scheme for CMOS transistors in sub-micron technologies is proposed to improve the modeling accuracy. Major electrical parameters of CMOS transistors in each sub-space from the design space are modeled with max-monomials. This approach is demonstrated to have a better accuracy for sub-micron technologies than single-space models. Sub-space modeling based geometric programming power optimization has been successfully applied to three different op-amps in 0.18 ??m technology. HSPICE simulation results show that sub-space modeling based GP optimization can allow efficient and accurate analog design. Computational effort can be managed to an acceptable level when searching sub-spaces for transistors by using practical constraints. An efficient scheme in dealing with non-convex constraint inherent in Kirchhoff´s voltage law is suggested in this paper. By using this scheme, the non-convex constraint, such as posynomial equality, can be relaxed to a convex constraint without affecting the result.
Keywords :
CMOS integrated circuits; MOSFET; SPICE; geometric programming; operational amplifiers; optimisation; CMOS op-amps; CMOS transistors; HSPICE simulation; Kirchhoff´s voltage law; analog design; nonconvex constraint; posynomial equality; power optimization; single-space models; sub-micron technologies; sub-space based geometric programming; sub-space max-monomial modeling; CMOS technology; Computational modeling; Design optimization; Kirchhoff´s Law; Operational amplifiers; Optimization methods; Semiconductor device modeling; Solid modeling; Space technology; Subspace constraints; CMOS op-amps; geometric programming; monomial; posynomial; power optimization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457151
Filename :
5457151
Link To Document :
بازگشت