DocumentCode :
2258302
Title :
Use of stress-screened components as an economical alternative to system level burn-in
Author :
Dassatti, Rick
Author_Institution :
Digital Equipment Corporation Burlington, Vermont
fDate :
April 28 1986-1986
Firstpage :
113
Lastpage :
118
Abstract :
This paper discusses the viability of using stress screened components as an alternative to system burn-in. Models are presented that were designed to aid the user in making financially responsible decisions concerning investment in infancy removal. A key assumption of this paper is that component infancy is the single most important factor needing attention in steady state products which have employed reasonably sound design and manufacturing practices. The value of the model is in its architecture; specific results from the application of the model will vary from business to business. The objective of this paper is to provide the Technical, Business and Financial communities the ability to communicate on such a diverse subject with a common language, toward a common goal.
Keywords :
Biological system modeling; Business; Capacitors; Integrated circuits; Manufacturing; Power systems; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Power Electronics Conference and Exposition, 1986 IEEE
Conference_Location :
New Orleans, Louisiana, USA
ISSN :
1048-2334
Type :
conf
DOI :
10.1109/APEC.1986.7073325
Filename :
7073325
Link To Document :
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