DocumentCode
2258302
Title
Use of stress-screened components as an economical alternative to system level burn-in
Author
Dassatti, Rick
Author_Institution
Digital Equipment Corporation Burlington, Vermont
fDate
April 28 1986-1986
Firstpage
113
Lastpage
118
Abstract
This paper discusses the viability of using stress screened components as an alternative to system burn-in. Models are presented that were designed to aid the user in making financially responsible decisions concerning investment in infancy removal. A key assumption of this paper is that component infancy is the single most important factor needing attention in steady state products which have employed reasonably sound design and manufacturing practices. The value of the model is in its architecture; specific results from the application of the model will vary from business to business. The objective of this paper is to provide the Technical, Business and Financial communities the ability to communicate on such a diverse subject with a common language, toward a common goal.
Keywords
Biological system modeling; Business; Capacitors; Integrated circuits; Manufacturing; Power systems; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition, 1986 IEEE
Conference_Location
New Orleans, Louisiana, USA
ISSN
1048-2334
Type
conf
DOI
10.1109/APEC.1986.7073325
Filename
7073325
Link To Document