• DocumentCode
    2258302
  • Title

    Use of stress-screened components as an economical alternative to system level burn-in

  • Author

    Dassatti, Rick

  • Author_Institution
    Digital Equipment Corporation Burlington, Vermont
  • fDate
    April 28 1986-1986
  • Firstpage
    113
  • Lastpage
    118
  • Abstract
    This paper discusses the viability of using stress screened components as an alternative to system burn-in. Models are presented that were designed to aid the user in making financially responsible decisions concerning investment in infancy removal. A key assumption of this paper is that component infancy is the single most important factor needing attention in steady state products which have employed reasonably sound design and manufacturing practices. The value of the model is in its architecture; specific results from the application of the model will vary from business to business. The objective of this paper is to provide the Technical, Business and Financial communities the ability to communicate on such a diverse subject with a common language, toward a common goal.
  • Keywords
    Biological system modeling; Business; Capacitors; Integrated circuits; Manufacturing; Power systems; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Power Electronics Conference and Exposition, 1986 IEEE
  • Conference_Location
    New Orleans, Louisiana, USA
  • ISSN
    1048-2334
  • Type

    conf

  • DOI
    10.1109/APEC.1986.7073325
  • Filename
    7073325