• DocumentCode
    2258421
  • Title

    Double-gate MOSFETs: performance and technology options

  • Author

    Cristoloveanu, Sorin ; Allibert, Frédéric ; Zaslavsky, Alex

  • Author_Institution
    Lab. de Phys. des Composants a Semicond., ENSERG, Grenoble, France
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    459
  • Lastpage
    460
  • Abstract
    The advantages of double-gate (DG) SOI MOSFETs over conventional, single-gate transistors are described in terms of performance and potential for ultimate scaling. The peculiarity of DG-MOSFETs is that the top and bottom gates are biased simultaneously to establish equal surface potentials: VG2 = VG1 for identical gate oxides, or VG2 = VG1(t0X2/t0X1 ) to compensate for the difference in front and back oxide thickness. In fully depleted transistors with a thin enough film, controlling the channel from both sides, forces most of the carriers to flow in the middle of the film, according to the volume inversion concept. Volume inversion results in excellent properties, which will be reviewed in this paper. In particular, the carrier mobility is enhanced, so that the transconductance in double-gate mode exceeds twice the value observed in single-gate mode. A DGMOSFET is more than the sum of two classical transistors
  • Keywords
    MOSFET; carrier mobility; silicon-on-insulator; surface potential; SOI technology; carrier mobility; double-gate MOSFET; surface potential; transconductance; volume inversion; Biomembranes; Etching; Fabrication; Force control; Linear predictive coding; MOSFETs; Oxidation; Semiconductor films; Transconductance; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2001 International
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-7432-0
  • Type

    conf

  • DOI
    10.1109/ISDRS.2001.984544
  • Filename
    984544