• DocumentCode
    22585
  • Title

    Polarimetric Target Decomposition Based on Attributed Scattering Center Model for Synthetic Aperture Radar Targets

  • Author

    Jia Duan ; Lei Zhang ; Mengdao Xing ; YiFeng Wu ; Min Wu

  • Author_Institution
    Nat. Lab. of Radar Signal Process., Xidian Univ., Xi´an, China
  • Volume
    11
  • Issue
    12
  • fYear
    2014
  • fDate
    Dec. 2014
  • Firstpage
    2095
  • Lastpage
    2099
  • Abstract
    In this letter, a novel polarimetric target decomposition (PTD) method based on the attributed scattering center (ASC) model is proposed for man-made targets in synthetic aperture radar (SAR) images. By extracting attributed parameters, polarimetric characteristics of targets can be exploited by performing PTD on the extracting parameters of ASCs instead of pixels in conventional PTD algorithms. As a result, the integrity of target components is enhanced, leading to a reliable analysis on the polarimetric scattering mechanisms of SAR targets. In the proposal, an attributed parameters extraction method based on joint exploitation of multiple polarimetric channels and a target discriminating method based on a constant-false-alarm threshold are developed to improve its robustness in strong noise scenarios. Experimental results confirm the effectiveness of the proposed algorithm.
  • Keywords
    decomposition; radar imaging; radar polarimetry; synthetic aperture radar; ASC model; PTD method; SAR imaging; attributed parameters extraction method; attributed scattering center model; constant-false-alarm threshold; multiple polarimetric channel; polarimetric scattering mechanism; polarimetric target decomposition method; synthetic aperture radar target; target discriminating method; Radar imaging; Radar polarimetry; Scattering; Signal to noise ratio; Synthetic aperture radar; Attributed scattering centers (ASCs); joint polarization; polarimetric target decomposition (PTD); synthetic aperture radar (SAR);
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2014.2320053
  • Filename
    6822530