• DocumentCode
    2258502
  • Title

    Numerical analysis of negative surface discharge development in air at atmospheric pressure

  • Author

    Hai-Bao Mu ; Zeng-Hui Zhang ; Xian-Jun Shao ; Guan-Jun Zhang

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
  • fYear
    2011
  • fDate
    6-10 Sept. 2011
  • Firstpage
    329
  • Lastpage
    332
  • Abstract
    In this paper, a two-dimensional axial-symmetric fluid model is proposed to study the negative surface discharge development on insulator with needle-plane electrode in air at atmospheric pressure. The finite-element method (FEM) is employed to solve the convection-diffusion equations for electrons, positive and negative ions coupled with Poisson´s equation. Photoionization effect is considered in this model. The mechanisms of surface discharge process are discussed by considering the temporal and spatial evolution of the quantities described by the model. The simulation results of surface charge density and discharge current are also compared with experimental data based on Pockels technique.
  • Keywords
    Pockels effect; Poisson equation; dielectric materials; electrodes; finite element analysis; photoionisation; surface discharges; Pockels technique; Poisson equation; atmospheric pressure; convection diffusion equations; discharge current; finite element method; needle plane electrode; negative surface discharge development; numerical analysis; photoionization effect; surface charge density; surface discharge process; two dimensional axial symmetric fluid model; Atmospheric modeling; Discharges (electric); Ionization; Mathematical model; Numerical models; Surface discharges; finite-element method; numerical simulation; photoionizaiton; surface discharge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulating Materials (ISEIM), Proceedings of 2011 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-4-88686-074-3
  • Type

    conf

  • DOI
    10.1109/ISEIM.2011.6826336
  • Filename
    6826336