DocumentCode
2258587
Title
VLSI nano-scale interconnect induced crosstalk power estimation
Author
Seyedolhosseini, Atefesadat ; Masoumi, Nasser ; Mehri, Milad
Author_Institution
Adv. VLSI Lab., Univ. of Tehran, Tehran, Iran
fYear
2012
fDate
10-12 Dec. 2012
Firstpage
1
Lastpage
4
Abstract
In this paper output transfer function for two RLC interconnects considering capacitive and inductive coupling is extracted. Sufficient number of lumped elements is employed to verify the method. The novelty of this work is separation of energy consumed by victim and aggressor. A new method is presented to estimate the dissipated energy due to the crosstalk effect. Energy is estimated using output waveform and there is no need to use the conventional formulas. A suitable way to calculate interconnects dissipated energy by a well-known formula against the conventional methods is proposed with lower value of error that can be used for both aggressor and victim line.
Keywords
VLSI; integrated circuit interconnections; integrated circuit noise; VLSI nanoscale interconnect induced crosstalk power estimation; capacitive coupling; crosstalk effect; inductive coupling; output transfer function; two RLC interconnects;
fLanguage
English
Publisher
ieee
Conference_Titel
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location
Kyoto
Print_ISBN
978-1-4673-2654-4
Type
conf
DOI
10.1109/ICSJ.2012.6523435
Filename
6523435
Link To Document