DocumentCode :
2258601
Title :
Unsupervised Support Vector Machines with Perturbations
Author :
Kong, Xiangwei ; Zhao, Kun ; Deng, Naiyang
Author_Institution :
Sch. of Economic & Manage., Beijing Jiaotong Univ., Beijing
Volume :
1
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
147
Lastpage :
151
Abstract :
Support vector machines (SVMs) have been dominant learning techniques for almost ten years, and mostly applied to supervised learning problems. Recently nice results are obtained by two-class unsupervised and semi-supervised classification algorithms where the optimization problems based on bounded C-SVMs, bounded v-SVMs and Lagrangian SVMs respectively are relaxed to semi-definite programming (SDP). These support vector methods implicitly assume that training data in the optimization problems are known exactly. But in practice, the training data are usually subjected to measurement noise. Zhao et al proposed robust version to unsupervised and semi-supervised classification problems based on Bounded C-SVMs, which need to find the dual problem twice. In this paper we propose unsupervised classification algorithm based on primal problem of standard SVMs with perturbations, which directly relaxes it with label variables to a semi-definite programming. Numerical results confirm the robustness of the proposed method.
Keywords :
pattern classification; support vector machines; unsupervised learning; Lagrangian SVM; bounded C-SVM; bounded v-SVM; semidefinite programming; semisupervised classification algorithm; unsupervised classification algorithm; unsupervised support vector machines; Classification algorithms; Lagrangian functions; Machine learning; Noise measurement; Noise robustness; Optimization methods; Supervised learning; Support vector machine classification; Support vector machines; Training data; Semi-definiteProgramming; Support Vector Machines; robust; unsupervised learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3497-8
Type :
conf
DOI :
10.1109/IITA.2008.176
Filename :
4739553
Link To Document :
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