Title :
Co-simulation of AC power noise of CMOS microprocessor using capacitor charging modeling
Author :
Yoshikawa, Kenichi ; Nagata, M.
Author_Institution :
Grad. Sch. of Syst. Inf., Kobe Univ., Kobe, Japan
Abstract :
Power noise could decisively impact on the system performance of large-scale integration (LSI), with higher integration and lower power supply voltage. Power noise simulation becomes a key step in the design of LSI systems. This paper presents an original capacitor-charging model that expresses AC part of power consumption current and also demonstrates power noise simulation of a 32 bit microprocessor on a 90 nm CMOS test chip. On-chip power supply voltage and on-board power supply current variations are consistently given by both measurements and simulation.
Keywords :
CMOS integrated circuits; microprocessor chips; AC power noise; CMOS microprocessor; CMOS test chip; LSI system; capacitor charging modeling; cosimulation; large scale integration; lower power supply voltage; on-board power supply current variation; original capacitor charging model; power consumption current; power noise simulation; system performance;
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
DOI :
10.1109/ICSJ.2012.6523442