DocumentCode :
2258991
Title :
A reconfigurable multiprocessor architecture for a reliable face recognition implementation
Author :
Tumeo, Antonino ; Regazzoni, Francesco ; Palermo, Gianluca ; Ferrandi, Fabrizio ; Sciuto, Donatella
Author_Institution :
DEI, Politec. di Milano, Milan, Italy
fYear :
2010
fDate :
8-12 March 2010
Firstpage :
319
Lastpage :
322
Abstract :
Face Recognition techniques are solutions used to quickly screen a huge number of persons without being intrusive in open environments or to substitute id cards in companies or research institutes. There are several reasons that require to systems implementing these techniques to be reliable. This paper presents the design of a reliable face recognition system implemented on Field Programmable Gate Array (FPGA). The proposed implementation uses the concepts of multiprocessor architecture, parallel software and dynamic reconfiguration to satisfy the requirement of a reliable system. The target multiprocessor architecture is extended to support the dynamic reconfiguration of the processing unit to provide reliability to processors fault. The experimental results show that, due to the multiprocessor architecture, the parallel face recognition algorithm can achieve a speed up of 63% with respect to the sequential version. Results regarding the overhead in maintaining a reliable architecture are also shown.
Keywords :
face recognition; field programmable gate arrays; multiprocessing systems; parallel programming; reconfigurable architectures; dynamic reconfiguration; field programmable gate array; parallel software; reconfigurable multiprocessor architecture; reliable face recognition implementation; reliable system; target multiprocessor architecture; Application specific integrated circuits; Computer architecture; Design methodology; Embedded system; Face recognition; Field programmable gate arrays; Hardware; Multimedia systems; Multiprocessing systems; Reconfigurable architectures;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location :
Dresden
ISSN :
1530-1591
Print_ISBN :
978-1-4244-7054-9
Type :
conf
DOI :
10.1109/DATE.2010.5457185
Filename :
5457185
Link To Document :
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