DocumentCode
2259091
Title
Power consumption of logic circuits in ambipolar carbon nanotube technology
Author
Ben Jamaa, M. Haykel ; Mohanram, Kartik ; De Micheli, Giovanni
Author_Institution
Swiss Fed. Inst. of Technol., Lausanne, Switzerland
fYear
2010
fDate
8-12 March 2010
Firstpage
303
Lastpage
306
Abstract
Ambipolar devices have been reported in many technologies, including carbon nanotube field effect transistors (CNTFETs). The ambipolarity can be in-field controlled with a second gate, enabling the design of generalized logic gates with a high expressive power, i.e., the ability to implement more functions with fewer physical resources. Reported circuit design techniques using generalized logic gates show an improvement in terms of area and delay with respect to conventional CMOS circuits. In this paper, we characterize and study the power dissipation of generalized logic gates based on am-bipolar CNTFETs. Our results show that the logic gates in the generalized CNTFET library dissipate 28% less power on average than a library of conventional CMOS gates. Further, we also perform logic synthesis and technology mapping, demonstrating that synthesized circuits mapped with the library of ambipolar logic gates dissipate 57% less power than CMOS circuits. By combining the benefits coming from the expressive power of generalized logic and from the CNTFET technology, we demonstrate that we can reduce the energy-delay-product by a factor of 20?? using the ambipolar CNTFET technology.
Keywords
CMOS logic circuits; carbon nanotubes; integrated circuit design; logic circuits; logic gates; organic field effect transistors; power consumption; C; CMOS circuits; CNTFET; ambipolar carbon nanotube technology; ambipolar devices; carbon nanotube field effect transistors; circuit design; logic circuits; logic gates; logic synthesis; power consumption; power dissipation; technology mapping; CMOS logic circuits; CMOS technology; CNTFETs; Carbon nanotubes; Circuit synthesis; Energy consumption; Libraries; Logic circuits; Logic design; Logic gates;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010
Conference_Location
Dresden
ISSN
1530-1591
Print_ISBN
978-1-4244-7054-9
Type
conf
DOI
10.1109/DATE.2010.5457189
Filename
5457189
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