DocumentCode :
2259139
Title :
Two-terminal solid-state THz sources: state-of-the-art and novel devices
Author :
Haddad, G.I.
Author_Institution :
Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
fYear :
2001
fDate :
2001
Firstpage :
552
Abstract :
Summary form only given. This presentation will review the basic principles of operation and power-generation capabilities and limitations of various types of two-terminal devices including IMPATTs, TUNNETs, TEDs, RTDs and varactor multipliers. A new device will also be presented. As is well known, the power generation capability of solid-state devices is limited by various factors including the critical electric field for breakdown Ec, the saturated velocity of carriers, vs, the relative dielectric constant of the semiconductor material, εr, and the thermal resistance of the device. Most of these limitations can be circumvented by utilizing a vacuum-based diode. Therefore the basic properties and power generation capabilities of a vacuum-based diode utilizing tunneling from field-emitters, ballistic motion of carriers in vacuum which also has a relative dielectric constant of unity and good heat sinking capability will be presented. Because of the basic mechanisms involved we will refer to this device as a Ballistic Tunneling Transit Time Diode (BT3D)
Keywords :
Gunn devices; IMPATT diodes; resonant tunnelling diodes; submillimetre wave diodes; submillimetre wave generation; transit time devices; vacuum microelectronics; varactors; IMPATTs; RTDs; TEDs; TUNNETs; ballistic carrier motion; ballistic tunneling transit time diode; critical breakdown field; field-emitter tunneling; heat sinking capability; power-generation capability; relative dielectric constant; saturated carrier velocity; thermal resistance; two-terminal solid-state THz sources; vacuum-based diode; varactor multipliers; Dielectric breakdown; Dielectric constant; Electric breakdown; Power generation; Semiconductor device breakdown; Semiconductor diodes; Solid state circuits; Thermal resistance; Tunneling; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2001 International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7432-0
Type :
conf
DOI :
10.1109/ISDRS.2001.984575
Filename :
984575
Link To Document :
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