DocumentCode :
2259193
Title :
Recent advances in AlSb/InAs HEMTs for high-speed electronics
Author :
Boos, J.B. ; Bennett, B.R. ; Ancona, M.G. ; Kruppa, W. ; Park, D. ; Yang, M.J. ; Hobart, K.D. ; Bracker, A.S. ; Justh, E. ; Mittereder, J. ; Chang, W. ; Turner, N.H. ; Bass, R.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
fYear :
2001
fDate :
2001
Firstpage :
554
Abstract :
Future high-speed receiver and logic applications that require lightweight power supplies, long battery lifetime, improved efficiency, or high component density will require transistors that consume less power. AlSb/InAs HEMTs have intrinsic advantages for these high-speed, low-power-consumption applications due to the attractive material properties of this heterojunction material system that include high values of mobility, channel conductivity, and peak electron velocity at low electric field. For example, intrinsic fT values of 250 GHz have been obtained at VDS=600 mV and an fT of 90 GHz has been measured at VDS=100 mV. Furthermore, simulations of logic circuits that combine the HEMTs with resonant tunneling diodes show a power dissipation of only 0.3 mW/gate at 20 Gb/s when biased at 400 mV. The potential payoffs associated with this material system are, however, dependent on further improvements in the technology. In this talk, the current status of the design, fabrication, and characterization of Sb-based HEMTs at NRL will be presented including 1/f noise characterization, the use of an InAsSb channel and a TiW/Au gate metalization, and their integration with RITDs
Keywords :
1/f noise; III-V semiconductors; aluminium compounds; high electron mobility transistors; high-speed integrated circuits; low-power electronics; monolithic integrated circuits; resonant tunnelling diodes; semiconductor device metallisation; 1/f noise characterization; 100 mV; 400 mV; 600 mV; AlSb-InAs; AlSb/InAs HEMT; InAsSb channel; NRL; RITD; TiW-Au; TiW/Au gate metalization; channel conductivity; high-speed electronics; low electric field; low power transistors; mobility; peak electron velocity; resonant tunneling diodes; Batteries; Conducting materials; HEMTs; Heterojunctions; High-speed electronics; Logic; MODFETs; Material properties; Power supplies; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Device Research Symposium, 2001 International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7432-0
Type :
conf
DOI :
10.1109/ISDRS.2001.984577
Filename :
984577
Link To Document :
بازگشت