Title :
Influence of the power-consumption at non-fundamental frequency on Passive intermodulation generation
Author :
Takada, Kazumasa ; Ishibashi, D. ; Kuga, Nobuhiro
Author_Institution :
Fac. of Eng., Yokohama Nat. Univ., Yokohama, Japan
Abstract :
In this paper, the influence of the power-consumption at non-fundamental frequency on Passive Intermodulation generation is investigated. It is shown that nonlinear coefficients depend on the total power including the power of non-fundamental frequency, and the power-consumption at non-fundamental frequency affects PIM generation. Through a comparison of two types of PIM-sources characterized by different mechanism such as plated coaxial connectors and diodes, it is also shown that the power dependence of a3 is dominant in plated connector while the higher order PIM in multi-tone tests affects the 3rd PIM level in 2-tone tests when PIM-source is a diode-like junction.
Keywords :
circuit testing; passive networks; 2-tone test; PIM generation; PIM level; PIM sources; Passive intermodulation generation; diode-like junction; multitone tests; nonfundamental frequency; nonlinear coefficients; passive circuits; plated coaxial connectors; power consumption;
Conference_Titel :
CPMT Symposium Japan, 2012 2nd IEEE
Conference_Location :
Kyoto
Print_ISBN :
978-1-4673-2654-4
DOI :
10.1109/ICSJ.2012.6523468