Title :
Anomalous history behavior in stacked PD SOI gates
Author :
Ketchen, Mark B. ; Bhushan, Manjul
Author_Institution :
IBM Res., Yorktown Heights, NY, USA
fDate :
29 Sept.-2 Oct. 2003
Abstract :
In this article described a new experiment with multiple input stacked gates in which delays can be over 7% outside the 1SW/2SW range. This result, which is not predicted by models, is thought to be either a floating body SOI effect or related to traps in the gate oxide and would be present in bulk as well.
Keywords :
CMOS logic circuits; history; logic gates; silicon-on-insulator; switching; CMOS gate; SOI gate; gate oxide; gate switching; history; CMOSFET logic devices; History; Silicon on insulator technology; Switches;
Conference_Titel :
SOI Conference, 2003. IEEE International
Print_ISBN :
0-7803-7815-6
DOI :
10.1109/SOI.2003.1242939
