DocumentCode :
2259531
Title :
Illumination-Invariant Texture Classification Based on Self-Similarity and Gabor Wavelet
Author :
Jian, Muwei ; Chen, Shi ; Dong, Junyu
Author_Institution :
Sch. of Space Sci. & Phys., Shandong Univ. at Weihai, Weihai, China
Volume :
1
fYear :
2008
fDate :
20-22 Dec. 2008
Firstpage :
352
Lastpage :
355
Abstract :
The appearance of a surface texture is strongly dependent on the illumination direction. This is why current state-of-art surface texture classification methods require multiple training images captured under a variety of illumination conditions for each class. This paper presents an inexpensive method for illumination-invariant texture classification based on self-similarity and wavelet transform. First, we train images for per class, which are captured under a variety of illumination conditions, to produce a similarity map based on self-similarity to represent this class. In allusion to each image in the database, We also employ a self-similarity map to represent the right image. For similarity map of the test images, which are most different from the training images (different illumination slants of the same texture), are transform by wavelet decomposition to extract texture feature and perform one-aganinst-one SVM algorithm for classification. We use a wide range of textures in the Pho-Tex database for the experiments to evaluate the performance of the proposed method. Although simple, the scheme has produced promising results.
Keywords :
Gabor filters; feature extraction; image classification; image representation; image texture; learning (artificial intelligence); support vector machines; wavelet transforms; Gabor wavelet transform; Pho-Tex database; feature extraction; illumination-invariant surface texture classification; image representation; inexpensive method; multiple training image; one-aganinst-one SVM algorithm; self-similarity map; wavelet decomposition; Feature extraction; Image databases; Lighting; Performance evaluation; Spatial databases; Support vector machine classification; Support vector machines; Surface texture; Testing; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3497-8
Type :
conf
DOI :
10.1109/IITA.2008.525
Filename :
4739593
Link To Document :
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