Stretching the limits of FPGA SerDes for enhanced ATE performance

This paper describes a multi-gigahertz test module to enhance the performance capabilities of automated test equipment (ATE), such as high-speed signal generation, loopback testing, jitter injection, etc. The test module includes a core logic block consisting of a high-performance FPGA. It is designed to be compatible with existing ATE infrastructure; connecting to the device under test (DUT) via a device interface board (DIB). The core logic block controls the test module´s functionality, thereby allowing it to operate independently of the ATE. Exploiting recent advances in FPGA SerDes, the test module is able to generate very high (multi-GHz) data rates at a relatively low cost. In this paper we demonstrate multiplexing logic to generate higher data rates (up to 10Gbps) and a low-jitter buffered loopback path to carry high speed signals from the DUT back to the DUT. The test module can generate 10Gbps signals with ~32ps (p-p) jitter, while the loopback path adds ~20ps (p-p) jitter to the input signal.