Title :
VTEG: VHDL test environment generator
Author :
Saha, Sudip ; Sriram, Sujatha
Keywords :
Automatic testing; Consumer electronics; Design engineering; Engines; Floods; Hardware design languages; Logic testing; Monitoring; Programmable logic devices; Technological innovation;
Conference_Titel :
Consumer Electronics, 2004 IEEE International Symposium on
Print_ISBN :
0-7803-8527-6
DOI :
10.1109/ISCE.2004.1376003
